The Plotting of Laue X-Ray Diffraction Pattern by Computation

dc.date.accessioned	2014-10-27T15:24:21Z
dc.date.available	2014-10-27T15:24:21Z
dc.date.issued	1985-06-??	zh_TW
dc.description.abstract	以入射X光方向為準，若晶體的方向為已知，則其勞伊X－光繞射圖形可以微電腦計算繪製。這些圖形可當作標準圖形，直接和相同情況下實驗的圖形比較而定出實驗時各繞射面之指數。	zh_tw
dc.description.abstract	Laue x-ray diffraction patterns are generated by computation when the orienta-tion of crystal as referred to incident x-ray beam is known. These plots can serve as standard patterns to index Laue photographs directly.	en_US
dc.identifier	68792D68-1F86-4611-0961-A4D34C6B2DFE	zh_TW
dc.identifier.uri	http://rportal.lib.ntnu.edu.tw/handle/20.500.12235/17255
dc.language	英文	zh_TW
dc.publisher	國立臺灣師範大學研究發展處	zh_tw
dc.publisher	Office of Research and Development	en_US
dc.relation	(30)，469-479	zh_TW
dc.relation.ispartof	師大學報	zh_tw
dc.subject.other	X光	zh_tw
dc.subject.other	計算	zh_tw
dc.subject.other	勞伊	zh_tw
dc.subject.other	圖形	zh_tw
dc.subject.other	繞射	zh_tw
dc.subject.other	繪製	zh_tw
dc.title	The Plotting of Laue X-Ray Diffraction Pattern by Computation	zh-tw
dc.title.alternative	勞伊X－光繞射圖形之微電腦計算及繪製	zh_tw

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