The Plotting of Laue X-Ray Diffraction Pattern by Computation

dc.date.accessioned2014-10-27T15:24:21Z
dc.date.available2014-10-27T15:24:21Z
dc.date.issued1985-06-??zh_TW
dc.description.abstract以入射X光方向為準,若晶體的方向為已知,則其勞伊X-光繞射圖形可以微電腦計算繪製。這些圖形可當作標準圖形,直接和相同情況下實驗的圖形比較而定出實驗時各繞射面之指數。zh_tw
dc.description.abstractLaue x-ray diffraction patterns are generated by computation when the orienta-tion of crystal as referred to incident x-ray beam is known. These plots can serve as standard patterns to index Laue photographs directly.en_US
dc.identifier68792D68-1F86-4611-0961-A4D34C6B2DFEzh_TW
dc.identifier.urihttp://rportal.lib.ntnu.edu.tw/handle/20.500.12235/17255
dc.language英文zh_TW
dc.publisher國立臺灣師範大學研究發展處zh_tw
dc.publisherOffice of Research and Developmenten_US
dc.relation(30),469-479zh_TW
dc.relation.ispartof師大學報zh_tw
dc.subject.otherX光zh_tw
dc.subject.other計算zh_tw
dc.subject.other勞伊zh_tw
dc.subject.other圖形zh_tw
dc.subject.other繞射zh_tw
dc.subject.other繪製zh_tw
dc.titleThe Plotting of Laue X-Ray Diffraction Pattern by Computationzh-tw
dc.title.alternative勞伊X-光繞射圖形之微電腦計算及繪製zh_tw

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