The Plotting of Laue X-Ray Diffraction Pattern by Computation
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Date
1985-06-??
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國立臺灣師範大學研究發展處
Office of Research and Development
Office of Research and Development
Abstract
以入射X光方向為準，若晶體的方向為已知，則其勞伊X－光繞射圖形可以微電腦計算繪製。這些圖形可當作標準圖形，直接和相同情況下實驗的圖形比較而定出實驗時各繞射面之指數。
Laue x-ray diffraction patterns are generated by computation when the orienta-tion of crystal as referred to incident x-ray beam is known. These plots can serve as standard patterns to index Laue photographs directly.
Laue x-ray diffraction patterns are generated by computation when the orienta-tion of crystal as referred to incident x-ray beam is known. These plots can serve as standard patterns to index Laue photographs directly.