Optical Characterization of Wurtzite Gallium Nitride Nanowires

dc.contributor國立臺灣師範大學化學系zh_tw
dc.contributor.authorM.-W. Leeen_US
dc.contributor.authorH.-Z. Twuen_US
dc.contributor.authorChia-Chun Chenen_US
dc.contributor.authorC.-H. Chenen_US
dc.date.accessioned2014-12-02T06:41:30Z
dc.date.available2014-12-02T06:41:30Z
dc.date.issued2001-11-26zh_TW
dc.description.abstractThe optical properties of the gallium nitride(GaN)nanowires are examined by the transmission method in the ultraviolet-visible range (1–5 eV) and by the reflection method in the infrared range (500–4000 cm−1). The absorption edge of the GaNnanowires is blueshifted by 0.2 eV from the bulk edge. The temperature dependence of the energy gap is expressed by, Eg(T)=3.724−9.97×10−4/(861+T) eV. The plasma frequency and the free-carrier density of the GaNnanowires, deduced from the infrared reflectance minima, are estimated to be ωp=1100±120 cm−1 and nf=3.73×1017 cm−3, respectively. Obtaining the free-carrier density from the infrared reflectance spectra is especially useful in research on nanostructured semiconductors.en_US
dc.description.urihttp://scitation.aip.org/docserver/fulltext/aip/journal/apl/79/22/1.1416476.pdf?expires=1395213453&id=id&accname=424340&checksum=F5ABD585E86EEF39E7B862C69827F89Azh_TW
dc.identifierntnulib_tp_C0301_01_008zh_TW
dc.identifier.issn0003-6951zh_TW
dc.identifier.urihttp://rportal.lib.ntnu.edu.tw/handle/20.500.12235/42292
dc.languageen_USzh_TW
dc.publisherAmerican Institute of Physics(AIP) Publishingen_US
dc.relationApplied Physics Letters, 79(22), 3693-3695.en_US
dc.relation.urihttp://dx.doi.org/10.1063/1.1416476zh_TW
dc.titleOptical Characterization of Wurtzite Gallium Nitride Nanowiresen_US

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