Optical Characterization of Wurtzite Gallium Nitride Nanowires
dc.contributor | 國立臺灣師範大學化學系 | zh_tw |
dc.contributor.author | M.-W. Lee | en_US |
dc.contributor.author | H.-Z. Twu | en_US |
dc.contributor.author | Chia-Chun Chen | en_US |
dc.contributor.author | C.-H. Chen | en_US |
dc.date.accessioned | 2014-12-02T06:41:30Z | |
dc.date.available | 2014-12-02T06:41:30Z | |
dc.date.issued | 2001-11-26 | zh_TW |
dc.description.abstract | The optical properties of the gallium nitride(GaN)nanowires are examined by the transmission method in the ultraviolet-visible range (1–5 eV) and by the reflection method in the infrared range (500–4000 cm−1). The absorption edge of the GaNnanowires is blueshifted by 0.2 eV from the bulk edge. The temperature dependence of the energy gap is expressed by, Eg(T)=3.724−9.97×10−4/(861+T) eV. The plasma frequency and the free-carrier density of the GaNnanowires, deduced from the infrared reflectance minima, are estimated to be ωp=1100±120 cm−1 and nf=3.73×1017 cm−3, respectively. Obtaining the free-carrier density from the infrared reflectance spectra is especially useful in research on nanostructured semiconductors. | en_US |
dc.description.uri | http://scitation.aip.org/docserver/fulltext/aip/journal/apl/79/22/1.1416476.pdf?expires=1395213453&id=id&accname=424340&checksum=F5ABD585E86EEF39E7B862C69827F89A | zh_TW |
dc.identifier | ntnulib_tp_C0301_01_008 | zh_TW |
dc.identifier.issn | 0003-6951 | zh_TW |
dc.identifier.uri | http://rportal.lib.ntnu.edu.tw/handle/20.500.12235/42292 | |
dc.language | en_US | zh_TW |
dc.publisher | American Institute of Physics(AIP) Publishing | en_US |
dc.relation | Applied Physics Letters, 79(22), 3693-3695. | en_US |
dc.relation.uri | http://dx.doi.org/10.1063/1.1416476 | zh_TW |
dc.title | Optical Characterization of Wurtzite Gallium Nitride Nanowires | en_US |