Application of the S-P chart to select judges in industrial electronics skill certification testing

dc.contributor國立臺灣師範大學工業教育學系zh_tw
dc.contributor.authorDar-chin Rauen_US
dc.contributor.authorShwu-huey Tzengen_US
dc.contributor.authorChien-yun Daien_US
dc.contributor.authorShang-jin Wengen_US
dc.contributor.authorHow-gao Hsuen_US
dc.contributor.authorYan-dan Linen_US
dc.date.accessioned2014-10-30T09:33:21Z
dc.date.available2014-10-30T09:33:21Z
dc.date.issued1995-12-01zh_TW
dc.identifierntnulib_tp_E0103_03_010zh_TW
dc.identifier.urihttp://rportal.lib.ntnu.edu.tw/handle/20.500.12235/35095
dc.languageenzh_TW
dc.relation95th Annual Convention of American Vocational Association (p.33). Denver, Colorado, USA.en_US
dc.titleApplication of the S-P chart to select judges in industrial electronics skill certification testingen_US

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