先進光碟奈米記錄點之檢測研究

Abstract

在本論文中，為使商用光碟機雷射讀寫光源達到最佳的讀寫效率以及提高記錄點訊號讀寫的重複性，我們藉由雷射讀寫光源寫入方式的改變 (Radial Orientation Spot, ROS type)，在商用可複寫式光碟片DVD+RW溝軌中，寫下串列的相變化記錄點訊號。並利用導電式原子力顯微儀 (Conductive Atomic Force Microscope, C-AFM) 探測相變化記錄點的技術，探討不同雷射讀寫光源寫入方式對於相變化記錄點形貌改變的影響。 此外，在以氧化鋅 (ZnOx) 作為近場主動層的近場光碟膜層結構中，為得到最佳化的記錄點讀寫訊號，我們藉由氧化鋅近場光碟膜層結構的改變以及C-AFM量測相變化記錄點的技術，分析並探討氧化鋅近場主動層對於相變化記錄層Ge2Sb2Te5的作用，並藉由實驗結果得到膜層結構改變對於記錄點讀寫訊號的影響。

In this study, to get the optimized reading and writing efficiency of the pick-up head in commercial optical driver and promote the repetition of recording marks on phase-change material, we record and readout series of mark trains on commercial rewritable DVD disk (DVD+RW) with radial orientation spot (ROS type). For further studies, the technique of imaging phase-change recording marks with conductive atomic force microscope (C-AFM) is applied to investigate the relation between different writing strategy and the topographic change of recording marks. Moreover, in the study of the near-field optical disk with zinc oxide (ZnOx) near-field active layer, we also optimize the layered structure of ZnOx-type near-field optical disk and investigate the recording marks with C-AFM. From the experimental results, the optical and thermal effect of ZnOx near-field active layer can be obtained and the readout signals of layered structure change are studied as well.