Electrochromic properties and Raman spectroscopy analysis of RF sputtered tungsten oxide thin films
| dc.contributor | 國立臺灣師範大學機電工程學系 | zh_tw |
| dc.contributor.author | Cheng, C. P. | en_US |
| dc.contributor.author | Lin, S. H. | en_US |
| dc.contributor.author | Hung, F. Y. | en_US |
| dc.date.accessioned | 2014-10-30T09:36:08Z | |
| dc.date.available | 2014-10-30T09:36:08Z | |
| dc.date.issued | 2009-12-04 | zh_TW |
| dc.identifier | ntnulib_tp_E0401_02_053 | zh_TW |
| dc.identifier.uri | http://rportal.lib.ntnu.edu.tw/handle/20.500.12235/36861 | |
| dc.language | en | zh_TW |
| dc.relation | 台灣鍍膜科技協會主辦。2009 國際薄膜技術會議，台北科技大學。 | zh_tw |
| dc.relation | TACT 2009 International Thin Films Conference, Taipei. | en_US |
| dc.title | Electrochromic properties and Raman spectroscopy analysis of RF sputtered tungsten oxide thin films | en_US |