場離子顯微鏡研究 (1)量測覆銥單原子針場發射與場離子電流 (2)鈮(100)表面觀察

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dc.contributor傅祖怡zh_TW
dc.contributor黃英碩zh_TW
dc.contributorTsu-Yi Fuen_US
dc.contributorIng-Shouh Hwangen_US
dc.contributor.author蘇冠宇zh_TW
dc.contributor.authorKuan-Yu Suen_US
dc.date.accessioned2019-09-05T02:28:05Z
dc.date.available2012-8-1
dc.date.available2019-09-05T02:28:05Z
dc.date.issued2012
dc.description.abstract覆銥單晶鎢針經數次加熱退火長成金字塔結構後，以法拉第杯與微通道板量測金字塔結構的場離子電流與場發射電子電流。對場發射電流而言，針形的尖銳度比金字塔結構的影響更大。離子電流的起始電壓是由針型尖銳度影響，飽和離子電流由金字塔結構影響，且發現微通道板量測飽和離子電流時的放大倍率約為法拉第杯量測的5000倍。多晶鈮針在數次加熱退火後，(100)面確實產生皺化。zh_TW
dc.description.abstractUsing Fraday cup and MCP (microchannel plate) measured field emission currents and field ion currents after Ir covered single crystal tungsten tips form pyramid strcture. Tip’s shape affects field emission current more then pyramid strcture. Threshold voltage of field evaporation is affected by sharpness of tip. Satuaration ion current is affected by pyramid structure. Satuaration ion current which is measured with MCP isbigger then satuaration ion current which is measured with Faraday cup 5000 times. Nb {100} can be faceting because Nb{310} expands after annealing.en_US
dc.description.sponsorship物理學系zh_TW
dc.identifierGN0699410450
dc.identifier.urihttp://etds.lib.ntnu.edu.tw/cgi-bin/gs32/gsweb.cgi?o=dstdcdr&s=id=%22GN0699410450%22.&%22.id.&
dc.identifier.urihttp://rportal.lib.ntnu.edu.tw:80/handle/20.500.12235/102797
dc.language中文
dc.subject覆銥鎢針zh_TW
dc.subject法拉第杯zh_TW
dc.subject場離子電流zh_TW
dc.subject場發射電子電流zh_TW
dc.subject多晶鈮針zh_TW
dc.subject鎢zh_TW
dc.subject鈮zh_TW
dc.subjectIr covered W tipen_US
dc.subjectFraday cupen_US
dc.subjectfield ion currenten_US
dc.subjectfield emission currenten_US
dc.subjectNb tipen_US
dc.subjecttungstenen_US
dc.subjectniobiumen_US
dc.title場離子顯微鏡研究 (1)量測覆銥單原子針場發射與場離子電流 (2)鈮(100)表面觀察zh_TW
dc.titleStudy using field ion microscope (1)Measuring field emission current and field ion current of Ir covered single atom tip (2)Direct observations of Nb(100) surfacesen_US

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