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科技與工程學院
光電工程研究所
學位論文
學位論文
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http://rportal.lib.ntnu.edu.tw/handle/20.500.12235/73896
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search.filters.author.Shiue Chiun Da
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search.filters.author.薛群達
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search.filters.subject.phase-change material
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search.filters.subject.atomic force microscopy
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search.filters.subject.optical pump-probe system
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search.filters.subject.wet-etching
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search.filters.subject.原子力顯微儀
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相變化薄膜光熱效應奈米微影
(
2009
)
薛群達
;
Shiue Chiun Da
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本論文主旨在於研究不同膜層結構的相變化材料對鹼性溶液之蝕刻特性。利用萊卡光譜儀與表面輪廓儀來量測薄膜蝕刻後之光學與物理性質,並使用波長658nm之紅光雷射泵探系統(靜態測試儀)製作樣品。經過溶液蝕刻後,由原子力顯微儀(Atomic Force Microscope)對記錄點進行掃探所得到的表面形貌資訊,來研究不同膜層結構相變化薄膜之記錄點型態。並可充分且完整的了解相變化材料在光熱作用與濕式蝕刻下之變化。將來可應用於奈米微影技術,用以取代昂貴的半導體製程技術。
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