鄭淳護Cheng, Chun-Hu紀柏宇Chi, Po-Yu2025-12-092030-01-092025https://etds.lib.ntnu.edu.tw/thesis/detail/2e7401e219000fd10228723a1c9d9e14/http://rportal.lib.ntnu.edu.tw/handle/20.500.12235/125202探討氮化鈦介面層應用於氧化鋁鉿鐵電記憶體之電性可靠度研究Electrical and Reliability Investigation of Hafnium Aluminum Oxide Ferroelectric Memory Using a Titanium Nitride Interface Layer學術論文