鄭淳護Cheng, Chun-Hu張嘉祐Chang, Chia-Yu2025-12-092030-05-312025https://etds.lib.ntnu.edu.tw/thesis/detail/8c23e25e3e4aafbb398c6a01f1b6df0d/http://rportal.lib.ntnu.edu.tw/handle/20.500.12235/125197探討氧化鋯介面層應用於氧化鋯鉿鐵電記憶體之電性可靠度研究Electrical and Reliability Investigation of hafnium-Zirconium-Oxide Ferroelectric Memory Using a Zirconium-Oxide Interface Layer學術論文